Tester for integrated circuit

Abstract

PURPOSE:To test an integrated circuit easily and quickly with free control of the weight or the like of a test pattern by controlling a random number distribution converter for controlling the random number responding to a random number generator with an external binary digit. CONSTITUTION:The distribution of a uniform random number of a fundamental input from a uniform random number generator 10 is controlled with a random number distribution converter 12 according to binary digits alpha and beta from an external unit 11. With the value alpha, the right and left movement of the probability distribution varies with a conversion function unit 13 of an equipment 12 to determine the right and left balance with respect to the weight center while with the value beta, the geometry of the distribution changes through a conversion function unit 14 to control the ratio of magnitude between the center peak of the probability distribution and both ends thereof. A test pattern is outputted from a test pattern generator 15 responding to the equipment 12 to test a 2 input AND gate with the probability of 3/4 for the appearance of 0, for instance, by a pattern of the corresponding appearance probability thereby enable the testing of an integrated circuit easily and quickly.

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Cited By (4)

    Publication numberPublication dateAssigneeTitle
    JP-2009156761-AJuly 16, 2009Hitachi Ltd, Renesas Technology Corp, 株式会社ルネサステクノロジ, 株式会社日立製作所Semiconductor device
    JP-H0682528-AMarch 22, 1994Internatl Business Mach Corp , インターナショナル・ビジネス・マシーンズ・コーポレイション制御可能な重み付き2進シーケンスを発生するための回路
    US-5239262-AAugust 24, 1993International Business Machines CorporationIntegrated circuit chip with built-in self-test for logic fault detection
    US-7734973-B2June 08, 2010Fujitsu Microelectronics LimitedTesting apparatus and testing method for an integrated circuit, and integrated circuit